The research group of the Materials Science Faculty of
The AFM is based on the principle of detecting force between atoms that acts between the probe and the sample surface. When atoms come closer to nm-level, they have forces of interaction. These forces are the Coulombic and van der Waals interactions. As they are very sensitive to the distance between atoms, the forces that act on the probe when it is scanned on the surface of sample sensitively varies according to the arrangement of atoms on the surface. When this force is detected sample surface can be observed in nm-level resolution.
AFM has an advantage over STM (Scanning Tunneling Microscope): to survey the surface of non-metallic materials and biological samples as well as conducting materials.
AFM is an integral whole of such cutting-edge technologies as nN-level force detecting, nm-level transmission and scanning, micro-signal sensing and processing, anti-vibration and computer combination control and image processing.
The AFM developed for the first time by the Materials Science Faculty of
The research group certified the scientific accuracy and practicability of its performance through observations of the standard specimen and various other utility samples and comparative analysis with other analytical means.
The AFM was registered as a national sci-tech achievement on April 18, Juche 102(2013) and won the first prizes both in the 10th national nanotechnology exhibition in August and the 7th national exhibition of university scientific research achievements in October.
It was also honoured with February 16 Science and Technology Prize, the top national science and technology award, in February Juche 103(2014).
It is now widely used by students majoring in nanomaterials in their experiments and observation of nanostructures of different materials on the surface.
